Long-term power degradation analysis of crystalline silicon PV modules using indoor and outdoor measurement techniques

Annual degradation rates of PV modules are important in the yield prediction. For a high-quality module, these lower than measurement uncertainty nominal power performed todays most advanced certified photovoltaic reference laboratory. Therefore, analysis requires well thought out methodology that can compare data relative to each other or an unused module stored dark on annual base. Over past 10 years, several multi c-Si and HIT have been accurately monitored string single setup by outdoor performance system. Additionally, all dismantled measured using indoor flasher system once every year. With this unique setup, quantified based three different methodologies. The showed average rate 0.18% ± 0.06% 0.29% system, respectively. yielded 0.26% 0.05%. That corresponds half observed method. Further evaluations ratio PR confirmed results gained methodology. comparison standard with temperature-corrected PR’STC for both technologies benefit temperature coefficient technology is eliminated its worse low light behaviour.